Author/Authors :
Hosokawa، نويسنده , , Tomoko and Fujiki، نويسنده , , Satoshi and Kuwahara، نويسنده , , Eiji and Kubozono، نويسنده , , Yoshihiro and Kitagawa، نويسنده , , Hiroshi and Fujiwara، نويسنده , , Akihiko and Takenobu، نويسنده , , Taishi and Iwasa، نويسنده , , Yoshihiro، نويسنده ,
Abstract :
Electronic properties of the major and minor isomers of Pr@C82, I (C2v) and II (Cs), are studied by Raman scattering, resistivity measurement, scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). The valences of the Pr atom in both isomers are determined to be +3 based on the Raman shift in the Pr–C82 stretching mode. The transport properties showed that both isomers are normal semiconductors with a small energy gap (Eg). STM of isomer I shows internal structures dependent on bias voltage Vs, and STS shows that this isomer is a semiconductor with Eg = 0.7 eV.
