Title of article :
PALS and SPM/EFM investigation of charged nanoporous electret films
Author/Authors :
Chiang، نويسنده , , Dar-Ming and Liu، نويسنده , , Wenliang and Chen، نويسنده , , Jen-Luan and Susuki، نويسنده , , Ryoichi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
5
From page :
50
To page :
54
Abstract :
The electret properties of nanoporous Teflon-FEP films, fabricated by the super-critical fluids method and charged by the corona method at room temperature, are investigated. PALS and SAXS are applied first to examine the charge characteristics of a free volume of electret materials. The topography and surface charges of electret materials are determined by scanning probe microscopy and electric field microscopy, respectively. The experimental results reveal that the interior surface areas of the pores of the electret materials influence the retention and stability of charge. Initial and aged surface charge was increased by factors of two and ten, with and without nanoporous Teflon-FEP films, respectively.
Journal title :
Chemical Physics Letters
Serial Year :
2005
Journal title :
Chemical Physics Letters
Record number :
1916124
Link To Document :
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