Title of article
Ordering of liquid squalane near a solid surface
Author/Authors
Mo، نويسنده , , Haiding and Evmenenko، نويسنده , , Guennadi and Dutta، نويسنده , , Pulak، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
106
To page
109
Abstract
X-ray reflectivity is used to study the interfacial structure of liquid squalane on SiO2/Si(1 0 0) substrates. The data show that there are density oscillations (‘layers’) near the interface, with the squalane molecular long axes parallel to the substrate. The results are compared to those from molecular dynamics simulations and recent force measurements.
Journal title
Chemical Physics Letters
Serial Year
2005
Journal title
Chemical Physics Letters
Record number
1916650
Link To Document