Author/Authors :
Mu، نويسنده , , Wei and Kerr، نويسنده , , Lei L. and Leyarovska، نويسنده , , Nadia، نويسنده ,
Abstract :
p-Type nitrogen doped ZnO was studied by using extended X-ray absorption fine structure (EXAFS) at the Zn K edge. The p-type ZnO was fabricated on glass substrates by a low cost catalyst-free thermal evaporation process. The EXAFS measurement showed that the bonding length of Zn–O and Zn–Zn was increased after converting to p-type due to the incorporation of nitrogen atoms. The EXAFS analysis indicated that N atoms might exist as diatom form of N–N in ZnO film.
