Author/Authors :
Zhou، نويسنده , , Z. and Bouwman، نويسنده , , W.G. and Schut، نويسنده , , H. and Pappas، نويسنده , , C.، نويسنده ,
Abstract :
The atomic structure of several nuclear graphite samples, an essential moderator material for nuclear reactors, has been investigated by X-ray diffraction. The patterns were analyzed by the conventional Rietveld refinement approach as well as by the CARBONXS model, which takes into account disorder and stacking faults. The refined parameters compiled with those from literature reveal a generic picture for the structure of all graphite specimens.