Author/Authors :
Moser، نويسنده , , Armin and Salzmann، نويسنده , , Ingo and Oehzelt، نويسنده , , Martin and Neuhold، نويسنده , , Alfred and Flesch، نويسنده , , Heinz-Georg and Ivanco، نويسنده , , Jan and Pop، نويسنده , , Sergiu and Toader، نويسنده , , Teodor and Zahn، نويسنده , , Dietrich R.T. and Smilgies، نويسنده , , Detlef-Matthias and Resel، نويسنده , , Roland، نويسنده ,
Abstract :
This Letter reports the impact of the evaporation rate on the crystallographic phase formation of vacuum deposited α-sexithiophene thin films studied by X-ray diffraction methods. The experiments reveal the formation of two crystal phases, one of which is a thermodynamically stable phase occurring at low rates, while the second is favored by high rates. This second phase exhibits an increased layer spacing and diffraction features typical for two-dimensional crystals which are laterally ordered but without interlayer correlations of the molecular positions. This disordered layered phase comprises molecules of nonuniform conformations, and is kinetically induced.
