Title of article :
A novel manufacturing defect detection method using association rule mining techniques
Author/Authors :
Wei-Chou Chen، نويسنده , , Shian-Shyong Tseng، نويسنده , , Ching-Yao Wang، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2005
Pages :
9
From page :
807
To page :
815
Keywords :
Defect detection , Interestingness measurement , Manufacturing defect detection problem , association rule mining
Journal title :
Expert Systems with Applications
Serial Year :
2005
Journal title :
Expert Systems with Applications
Record number :
198318
Link To Document :
https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=198318
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