مرکز منطقه ای اطلاع رساني علوم و فناوري - Clustered defect detection of high quality chips using self-supervised multilayer perceptron

Title of article :

Clustered defect detection of high quality chips using self-supervised multilayer perceptron

Author/Authors :

Chenn-Jung Huang، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2007

Pages :

From page :

996

To page :

1003

Keywords :

Defect detection , Median filter , Nearest neighbor , Clustering , Neural networks , Probing , Multilayer perceptron

Journal title :

Expert Systems with Applications

Serial Year :

2007

Journal title :

Expert Systems with Applications

Record number :

198709

Link To Document :