Author/Authors :
Kalbfleisch، نويسنده , , G.R. and Smith، نويسنده , , E.H. and Kaplan، نويسنده , , D.H. and Gutierrez، نويسنده , , P. and Kuehler، نويسنده , , J. and Skubic، نويسنده , , P. and Wood، نويسنده , , M. and McMahon، نويسنده , , T. and Snow، نويسنده , , J.M. and Bullough، نويسنده , , M. and Lucas، نويسنده , , A.D. and Wilburn، نويسنده , , C.D.، نويسنده ,
Abstract :
Measurements of the signal to noise, charge sharing, cluster distribution properties, charge correlation and spatial resolution as a function of angle of incidence have been conducted in a high energy pion beam at Fermilab for a variety of DC-coupled double-sided silicon microstripe detectors (Micron, Inc.) utilizing a special boron-spray technique for ohmic side isolation. Readout was accomplished with the Berkeley SVX-D IC/SRS/SDA sequencer system. Stripe pitch configurations included 50 μm and 25 μm with every stripe read out (“50∗1”, “25∗1”), and also with every other stripe read out (“50∗2”, “25∗2”). One of the detectors under study was 158 μm thick, rather than the usual 300 μm. Of interest are the establishment, for 300 μm thick detectors, of sub-2.5 μm resolution perpendicular to the beam on an ohmic side with 38 mm long stripes for both 25∗1 and 25∗2 configurations, and diode side (58 mm stripes) resolutions ranging from below 3 μm at near normal incidence to about 11 μm at 60°. At large angle the 25∗2 configuration generally gave comparable or better resolution than 25∗1. The thin detector gave a resolution ranging from about 5.5 μm at 21° to about 7 μm at 45° for 25∗1 and 6.4 to 9.0 μm for 25∗2, which, for each of the three common angles of data, was better than the resolution yielded by the 300 μm detector to which it was compared. Signals and charge sharing results are compared to detailed Monte Carlo calculations based on an energy loss distribution due to Bichsel.
