Title of article :
Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures
Author/Authors :
Rieder، نويسنده , , R. and Wobrauschek، نويسنده , , P. and Ladisich، نويسنده , , W. and Streli، نويسنده , , C. and Aiginger، نويسنده , , H. and Garbe، نويسنده , , S. and Gaul، نويسنده , , G. and Knِchel، نويسنده , , A. and Lechtenberg، نويسنده , , F.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
6
From page :
648
To page :
653
Abstract :
To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV. Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
1995
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
1993283
Link To Document :
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