Title of article
Total reflection X-ray fluorescence analysis with synchrotron radiation monochromatized by multilayer structures
Author/Authors
Rieder، نويسنده , , R. and Wobrauschek، نويسنده , , P. and Ladisich، نويسنده , , W. and Streli، نويسنده , , C. and Aiginger، نويسنده , , H. and Garbe، نويسنده , , S. and Gaul، نويسنده , , G. and Knِchel، نويسنده , , A. and Lechtenberg، نويسنده , , F.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
6
From page
648
To page
653
Abstract
To achieve lowest detection limits in total reflection X-ray fluorescence analysis (TXRF) synchrotron radiation has been monochromatized by a multilayer structure to obtain a relative broad energy band compared to Bragg single crystals for an efficient excitation. The energy has been set to 14 keV, 17.5 keV, 31 keV and about 55 keV. Detection limits of 20 fg and 150 fg have been achieved for Sr and Cd, respectively.
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
1995
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
1993283
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