The application of the X-ray standing wave method to study NiC layered structures obtained by laser-assisted deposition

The X-ray standing wave method using fluorescence yield mode was applied to study the profile of the component-by-component distribution between Ni and C layers in NiC layered structures produced by laser-assisted deposition. The method of recurrent relationships was used to calculate the standing wave electric field profile, and to reconstruct the Ni deep distribution. Best fitting was obtained if the intermixing thickness was equal to 3–4 Å.