Title of article
Subpixel resolution in 3D cone-beam microtomography
Author/Authors
Likhachov، نويسنده , , A.V and Pickalov، نويسنده , , V.V، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
6
From page
370
To page
375
Abstract
The application of synchrotron X-rays in industrial tomography is considered. The crack detection by tomography methods is in the scope of this paper. Numerical simulations of 3D cone-beam tomography problems are carried out. It is shown that small cracks can be reconstructed from the absorption measurements.
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Serial Year
1995
Journal title
Nuclear Instruments and Methods in Physics Research Section A
Record number
1994635
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