Title of article :
X-ray detection with submicron impact accuracy
Author/Authors :
Schmidt، نويسنده , , K.H. and Bِgner، نويسنده , , M. and Buschhorn، نويسنده , , G. and Kotthaus، نويسنده , , R. and Rzepka، نويسنده , , M. and Wroblewski، نويسنده , , T.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
3
From page :
634
To page :
636
Abstract :
Utilizing a commercial optical CCD camera with the smallest pixel size presently available (6.8 × 6.8 μm2) we have measured impact accuracies of 0.9 μm (rms) for 15 keV synchrotron radiation in direct photon counting mode. Of crucial importance was diffusion spreading of the deposited charge such that by centroid reconstruction interpolation between discrete pixel coordinates was possible.
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Serial Year :
1995
Journal title :
Nuclear Instruments and Methods in Physics Research Section A
Record number :
1994774
Link To Document :
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