Author/Authors :
Batignani، نويسنده , , G. and Bosisio، نويسنده , , L. and Focardi، نويسنده , , E. and Forti، نويسنده , , F. and Giorgi، نويسنده , , M. and Marangoni، نويسنده , , D. and Rizzo، نويسنده , , G. and Tonelli، نويسنده , , G. and Triggiani، نويسنده , , G.، نويسنده ,
Abstract :
In the last years several hundreds of large (∼25 cm2) double-sided silicon strip detectors have been designed and tested in our Pisa-INFN laboratory. These detectors are currently used in ALEPH and L3 vertices, and in other field of applications as well. We present the tests performed on a single detector, and we discuss some results on the test structures inserted in each wafer in order to measure the relevant, process-dependent, quantities which determine the detector performances.
