Author/Authors :
Lipton، نويسنده , , Ronald، نويسنده ,
Abstract :
We describe some aspects of the research and development performed for the 850 00 channel D0 upgrade silicon tracking system. The system includes seven disk/barrel modules in the central detector and four stations of large area disk detectors. Results are reported for the SVX II chip, radiation damage, and studies of “black holes” caused by faulty detector channels. Production and testing status is briefly described.