Author/Authors :
Brodbeck، نويسنده , , T.J and Chilingarov، نويسنده , , A، نويسنده ,
Abstract :
The various mechanisms which can cause broadening of the signal distribution in a microstrip detector are discussed, in turn, via a simple simulation. Some analytic results for calculating the effect of dead areas are also presented. A comparison is made of GaAs test beam data with the results of the simulation.
