Author/Authors :
Teichert، نويسنده , , Christian، نويسنده ,
Abstract :
In semiconductor heteroepitaxy the growing film frequently undergoes a series of strain relief mechanisms that may include surface reconstruction, step bunching, faceting, and finally formation of misfit dislocations. Under certain conditions, these mechanisms and their interplay result in self-organized nanostructure arrays with a high degree of uniformity. Using atomic force microscopy and X-ray diffraction investigations, the following mechanisms are analyzed in the model system of Si1−xGex molecular beam epitaxy Si(0 0 1): 1.
ion of ripple patterns by bunching of the preexisting steps on vicinal substrates,
unch faceting on high miscut substrates,
ated ripple propagation in heteroepitaxial superlattices,
lay of three-dimensional island arrangement and step-bunched ripple patterns,
lay of island arrangement and cross-hatched dislocation network,
ion of three-dimensionally ordered island arrays in multilayer films.
riving forces of these self-organization mechanisms—that are not restricted to a particular growth system—are discussed in the framework of continuum elasticity theory. Besides optoelectronic applications (not extensively considered here) a novel use of self-organized semiconductor nanostructures is proposed, namely the utilization as large-area templates to grow various materials on them. This is demonstrated for the case of magnetic thin films that can be nanostructured by this way.
Keywords :
Nanostructures , Semiconductor heteroepitaxy , strain , atomic force microscopy