Development of total uranium analytical method by L X-ray fluorescence

This paper describes development of an L X-ray fluorescence technique to perform total uranium analysis using an internal excitation source which is added directly to the sample. The method has been demonstrated with synthetic U samples in the limited concentration range 1–15 g/l, and provides the advantage of simplicity, involving no mechanical parts which would normally be found in an external excitation source. Total uranium is determined by counting L X-rays fluoresced by a microCurie level spike of 109Cd added directly to the sample and without shielding the excitation source from the detector. A method for correction of sample self-absorption is included in the analysis.