Author/Authors :
Chatzisotiriou، نويسنده , , V. and Christofis، نويسنده , , I. and Dimitriou، نويسنده , , N. and Dre، نويسنده , , Ch. and Haralabidis، نويسنده , , N. and Karvelas، نويسنده , , S. and Karydas، نويسنده , , A.G. and Loukas، نويسنده , , D. and Misiakos، نويسنده , , K. and Pavlidis، نويسنده , , A. and Perdikatsis، نويسنده , , V. and Psycharis، نويسنده , , V. and Spirou، نويسنده , , S. and Terzis، نويسنده , , A. and Turchetta، نويسنده , , R. and Tsoi، نويسنده , , E.، نويسنده ,
Abstract :
An X-ray Diffractometer for Powder Crystallography is described along with experimental results and future plans. This is an intermediate instrument toward a long linear array system. Three channels of a silicon microstrip detector, are the detecting elements in the present instrument. Each detector channel is followed by a VLSI readout chain, which consists of a charge preamplifier with pulse shaping circuitry, a discriminator, and a 16-bit counter. Control and data acquisition is performed with a custom made PC readout card. A motorized goniometer scans the angle range of interest. Calibration of the system is done with reference samples and data which are captured with a one-channel conventional NaI detector.
