Increasing reliability in gamma and X-ray spectral data analysis: least moduli approach

A method for increasing reliability of parameter estimations for X- and gamma-ray spectral data acquired by semiconductor detectors and multichannel analyzers has been developed. We describe the advantages of using the method of least moduli over the method of least squares when analyzing peaks with high peak/background ratios. The influence of different distortion factors was explored along with the limitations on applying the new method.