Title of article :
Two-channel X-ray reflectometer
Author/Authors :
A.G Touryanski، نويسنده , , A.G and Vinogradov، نويسنده , , A.V and Pirshin، نويسنده , , I.V، نويسنده ,
Abstract :
The two-channel X-ray reflectometer is proposed providing an increase in accuracy and sensitivity especially to nanoscale oxide layers. The reflectometer has two independent measuring channels controlled by a processor and the beam-splitting and spectral selection device based on a row of semitransparent plates of pyrolitic graphite. Results of reflection curve measurements in a relative mode are presented for an Ni film and GaAs monocrystal.
Keywords :
reflection , Oxide , GaAS , surface , X-rays , Thin film , Graphite
Journal title :
Astroparticle Physics
