Improved modeling of microchannel plate response to hard X-rays

An improved model for microchannel platequantum efficiency and response at higher X-ray energies (up to 100ʹs keV) is described, which builds on previous models by incorporating a more detailed consideration of photoelectron energies released in the MCP bulk. The contribution of multiple channel walls is included in the total response calculation. This model shows that MCP quantum efficiency and response decay as power law functions with energy, for photon energies>140 keV.