Author/Authors :
Povoli، نويسنده , , M. and Bagolini، نويسنده , , A. and Boscardin، نويسنده , , M. and Dalla Betta، نويسنده , , G.-F. and Giacomini، نويسنده , , G. and Hasi، نويسنده , , J. and Oh، نويسنده , , A. and Zorzi، نويسنده , , N.، نويسنده ,
Abstract :
We report on the functional characterization of planar sensors with active edges fabricated at Fondazione Bruno Kessler (FBK), Trento, Italy. The measurements here reported were performed by means of laser and X-ray beam scans mainly focusing on the signal efficiency of the edge region of the devices. Results are very encouraging and show very good sensitivity up to few microns away from the device physical edge.
Keywords :
Numerical simulations , TCAD , functional characterization , Test structures , Laser , Active edge , Silicon detectors , X-Ray
