Author/Authors :
Schieber، نويسنده , , M. and Hermon، نويسنده , , H. and Zuck، نويسنده , , A. and Vilensky، نويسنده , , A. and Melekhov، نويسنده , , L. and Shatunovsky، نويسنده , , R. and Meerson، نويسنده , , E. and Saado، نويسنده , , H.، نويسنده ,
Abstract :
The response for medical X-ray generator of single and polycrystalline HgI2 to 65 kVp X-rays has been compared to the response of single-crystal CdZnTe and PbI2 detectors using the current integration mode. The dark current density expressed in pA/mm2 and sensitivity expressed in μC/R×cm2 are given for these detectors for several thicknesses. The polycrystalline HgI2 thick film detectors were fabricated using the hot wall physical vapor-phase deposition (PVD) method.
Keywords :
Imaging , Mercuric iodide , Polycrystalline , X-Ray , Current mode detector
