Title of article :
Charge compensation in irradiated semiconductor devices using high-resistivity field plates
Author/Authors :
Parker، نويسنده , , Sherwood and Kenney، نويسنده , , Christopher، نويسنده ,
Pages :
7
From page :
101
To page :
107
Abstract :
A field-plate structure using a high-resistivity material is described. As with other field plates, it can be used to compensate trapped charges in semiconductor devices, including radiation detectors, but because little current flows through it during the time a pulse is present on the signal electrodes, it does not significantly increase the effective capacitance between signal electrodes or other structures near the plates.
Keywords :
Radiation damage , Field plates , Semiconductor radiation detectors , Charge compensation , Oxide trapped charge , Sensors , Polysilicon resistors
Journal title :
Astroparticle Physics
Record number :
2015150
Link To Document :
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