Title of article :
The energy-dispersive reflectometer at BESSY II: a challenge for thin film analysis
Author/Authors :
Pietsch، نويسنده , , U. and Grenzer، نويسنده , , J. and Geue، نويسنده , , Th. and Neissendorfer، نويسنده , , F. and Brezsesinski، نويسنده , , G. and Symietz، نويسنده , , Ch. and Mِhwald، نويسنده , , H. and Gudat، نويسنده , , W.، نويسنده ,
Pages :
4
From page :
1077
To page :
1080
Abstract :
Installed in 1999 the energy-dispersive reflectometer at the 13.2 bending magnet employs the exponentially decaying white X-ray emission spectrum of the 1.7 GeV storage ring of BESSY II outside the vacuum. Using an energy-dispersive detector specular and longitudinal-diffuse reflectivity spectra of thin films can be recorded simultaneously between 0.2 Å−1<qz<1.2 Å−1 within a few seconds. pability of the experiment is demonstrated probing the correlation length of Cd-arachidate and -stearate films at room temperature and its change during annealing. At T=70°C we observe an instantaneous decay of specular Bragg peaks accompanied with an increase of the diffuse scattering. This indicates the onset of the melting of 2D-ordered acid domains. The vertical diffusion coefficient is estimated to be about 2×10−24 m2/s.
Keywords :
Synchrotron radiation , Energy-dispersive reflectometry , X-ray diffuse scattering
Journal title :
Astroparticle Physics
Record number :
2016752
Link To Document :
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