Author/Authors :
Matsuya، نويسنده , , M. and Jinno، نويسنده , , S. and Ootsuka، نويسنده , , T. K. Inoue، نويسنده , , M. and Kurihara، نويسنده , , T. and Doyama، نويسنده , , M. and Inoue، نويسنده , , M. and Fujinami، نويسنده , , M.، نويسنده ,
Abstract :
A practical transmission positron microscope (TPM) JEM-1011B has been developed to survey differences in the interaction of positron and electron beams with materials, and is installed in the Slow Positron Facility of High Energy Accelerator Research Organization (KEK). The TPM can share positron and electron beams, and can also be used as a transmission electron microscope (TEM). Positron transmission images up to magnification 10,000× (resolution: 50 nm) and positron diffraction patterns up to 044 family were successfully obtained by the TPM comparing them with those of electrons. The differences in material transmittances for both beams have been measured, and can be explained by the calculated results of the Monte Carlo simulation code PENELOPE-2008.
Keywords :
scattering , optics , Electron , Microscope , brightness , Positron