Author/Authors :
Sinn، نويسنده , , H. and Alp، نويسنده , , E.E. and Alatas، نويسنده , , A. and Barraza، نويسنده , , J. and Bortel، نويسنده , , G. and Burkel، نويسنده , , E. and Shu، نويسنده , , D. and Sturhahn، نويسنده , , W. and Sutter، نويسنده , , J.P. and Toellner، نويسنده , , T.S. and Zhao، نويسنده , , J.، نويسنده ,
Abstract :
We present a new spectrometer at the Advanced Photon Source for inelastic X-ray scattering with an energy resolution of 2.2 meV at an incident energy of 21.6 keV. For monochromatization, a nested structure of one silicon channel cut and one ‘artificial’ channel cut is used in forward-scattering geometry. The energy analysis is achieved by a two-dimensional focusing silicon analyzer in backscattering geometry. In the first demonstration experiments, elastic scattering from a PlexiglasTM sample and two dispersion curves in a beryllium single crystal were measured. Based on these data sets, the performance of the new spectrometer is discussed.
