Author/Authors :
Tamura، نويسنده , , Masaya and Akimoto، نويسنده , , Tadashi and Aoki، نويسنده , , Yohei and Ikeda، نويسنده , , Jiro and Sato، نويسنده , , Koichi and Fujita، نويسنده , , Fumiyuki and Homma، نويسنده , , Akira and Sawamura، نويسنده , , Teruko and Narita، نويسنده , , Masakuni، نويسنده ,
Abstract :
When electrons at relativistic velocities pass through a crystal plate, such as silicon, photons are emitted around the Bragg angle for X-ray diffraction. This phenomenon is called parametric X-ray radiation (PXR). The monochromaticity and directivity of PXR are adequate and the energy can be changed continuously by rotating the crystal. This study measured the mass attenuation coefficient around the K-shell absorption edge of Nb, Zr and Mo as a PXR application of monochromatic hard X-ray radiation sources.
Keywords :
K absorption edge , Attenuation coefficient of X-ray , Parametric X-ray radiation (PXR) , Single crystal , Variable wavelength , Monochromatic X-ray
