Author/Authors :
Bergauer، نويسنده , , T and Fontaine، نويسنده , , J.C and Helleboid، نويسنده , , J.M and Krammer، نويسنده , , M and Macchiolo، نويسنده , , A، نويسنده ,
Abstract :
In the framework of the CMS experiment, a quality control of the silicon sensors production has been developed for the tracker construction. The emphasis here is on the process stability control based on the characterization of test-structures made of eight different components. The measurements carried out are presented. Then the set-up and the software developed for this purpose are explained. The first results, including the ones obtained on faulty batches of sensors, are shown.
Keywords :
Silicon microstrip detectors , CMS , High Energy Physics , quality assurance
