Author/Authors :
Petkov، نويسنده , , P. and Mِller، نويسنده , , O. and Tonev، نويسنده , , D. and Dewald، نويسنده , , A. and Brentano، نويسنده , , P.von، نويسنده ,
Abstract :
A new method for the analysis of delayed-coincidence lifetime experiments is proposed following the approach of the Differential decay-curve method. Examples of application of the procedure using simulated and experimental data reveal its reliability for lifetimes in the nanosecond and sub-nanosecond range. The procedure is expected to improve the treatment of systematic errors and scarce data. Possible further expansions and practical aspects of the procedure are also discussed.
