Author/Authors :
Schroer، نويسنده , , Christian G. and Boye، نويسنده , , Pit and Feldkamp، نويسنده , , Jan M. and Patommel، نويسنده , , Jens and Samberg، نويسنده , , Dirk and Schropp، نويسنده , , Andreas and Schwab، نويسنده , , Andreas and Stephan، نويسنده , , Sandra and Falkenberg، نويسنده , , Gerald and Wellenreuther، نويسنده , , Gerd and Reimers، نويسنده , , Nadja، نويسنده ,
Abstract :
We describe the hard X-ray scanning microscope planned for the new synchrotron radiation source PETRA III at DESY in Hamburg, Germany. It is based on nanofocusing refractive X-ray lenses and is designed for two-dimensional mapping and scanning tomography. It supports X-ray fluorescence and (coherent) diffraction contrast, yielding elemental and structural information from inside the sample. Spatial resolutions down to well below 50 nm are aimed for in direct space. A further increase in spatial resolution is expected by applying ptychographic scanning schemes. The optical scheme with a two-stage focusing optic is described.
Keywords :
Hard X-ray nanoprobe , Refractive X-ray lenses , Nanofocusing lenses , Hard X-ray scanning microscope
