A low-angle X-ray scatter breast-imaging system based on a novel multi-element Si-pad array operated in spectroscopic mode

A novel multi-element Si-pad array operated in spectroscopic mode was designed in collaboration with Sintef to measure low-angle X-ray scattered photons in the energy range of 12–45 keV with an FWHM energy resolution of about 4 keV. This detector is used as the ultra-sensitive diffraction detector in a dual-sensor X-ray breast-imaging scanning system. Each detector is wire-bonded to a high-density low-noise XA1.3 readout chip designed by IDE AS. A new DAQ system was also developed to be used in conjunction with the detector and the readout electronics. Results regarding the characterization of this new Si-pad detector and its performance to measure scattering signatures of several materials of interest are presented.