Development of an advanced X-ray detector for inspecting inner microscopic structural details in industrial applications

A new charge coupled device (CCD)-based X-ray detector, which uses a high-gain microchannel plate image intensifier for upfront optical gain, is proposed. The intensifier is directly coupled with the photosensitive surface of a CCD by a fiber optic taper and acts as both a converter and intensifier. Experimental results for the detector in X-ray imaging show that the detector currently has an intrinsic resolution of approximately 83 μm (12 lp/mm).