Author/Authors :
Artemiev، نويسنده , , A.N. and Artemiev، نويسنده , , N.A. and Zabelin، نويسنده , , A.V. and Kirillov، نويسنده , , B.F. and Kolotushkin، نويسنده , , V.P. and Kohn، نويسنده , , V.G. and Maevsky، نويسنده , , A.G. and Potlovsky، نويسنده , , K.G. and Rezvov، نويسنده , , V.A. and Shamov، نويسنده , , A.I. and Ioudin، نويسنده , , L.I.، نويسنده ,
Abstract :
The paper presents fluorescence EXAFS spectrometer developed at Kurchatov Synchrotron Radiation Center. The spectrometer allows one to study elements from Cr ( Z = 24 ) up to Bi ( Z = 83 ) . The important peculiarity of the spectrometer is the possibility to study thick undisturbed samples, retaining their history—annealing, seasoning, hardening and so on. The spectrometer consists of beam position monitor, channel cut monochromator, intensity monitor, sample holder and detector. The detectors consist of photomultipliers with scintillators. The EXAFS spectra of Ni–Cr alloys are measured and processed as the examples.
