Author/Authors :
Materna، نويسنده , , T. and Bruyneel، نويسنده , , B. and Jolie، نويسنده , , J. and Linnemann، نويسنده , , A. and Warr، نويسنده , , N. and Bِrner، نويسنده , , H.G. and Jentschel، نويسنده , , M. and Mutti، نويسنده , , P. and Simpson، نويسنده , , G.، نويسنده ,
Abstract :
A new method to correct imperfect bending of curved crystals used for γ-ray diffraction spectroscopy is presented. It relies on using position-sensitive segmented Ge-detectors and permits the determination of the emission area of each γ-ray from the crystals and therefore an off-line correction of bending imperfections as if the crystals were divided into independent 2×2 mm2 bent crystals. A first experiment using the GAMS-5 spectrometer (Institut Laue-Langevin) shows proof of the principle of the method.
