Author/Authors :
Ciriaco، نويسنده , , A. and Dav?`، نويسنده , , F. and Lebeau، نويسنده , , M. and Majni، نويسنده , , G. and Paone، نويسنده , , N. and Pietroni، نويسنده , , P. and Rinaldi، نويسنده , , D.، نويسنده ,
Abstract :
We systematically measured the photo-elastic parameter f σ of PbWO 4 (PWO) for crystals of different thicknesses. We observed a linear behaviour of f σ as a function of the thickness for low level applied stresses. This result was corroborated by numerical simulations. f σ allows the evaluation of the residual internal stress, useful for crystal quality control. In this work, we also propose a new polariscope based on laser light, which allows a fast measurement and mapping of the internal stress of crystals with high resolution owing to the reduced laser-beam dimension.
Keywords :
stress measurement , Photoelasticity , Scintillating crystals , PWO , quality control