Title of article
Thickness determination by measuring electron transmission in the TEM at 200 kV
Author/Authors
Pozsgai، نويسنده , , I.، نويسنده ,
Pages
7
From page
69
To page
75
Abstract
The dependence of electron microscopic contrast on atomic number has been separated experimentally from that on mass thickness in a Philips CM20 transmission electron microscope at 200 kV. The formula obtained for one-component films has been generalised for multicomponent films. A procedure for specimen thickness determination is proposed in conjunction with composition determination by energy dispersive X-ray spectrometry.
Journal title
Astroparticle Physics
Record number
2045036
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