Identifying locations on a substrate for the repeated positioning of AFM samples

A simple addition to the preparation of an AFM sample allows for the mapping of regions on the substrate. The technique makes use of copper locator grids placed under a translucent substrate such as mica or glass. This cost effective procedure allows one to reproducibly locate features over a sample surface area of approximately 7 mm2. Application of this procedure in locating a small group of spheres and in the annealing of a latex monolayer are shown. The procedure can also be of use in cases where the sample must be rotated or removed.