• Title of article

    Monte Carlo simulations of coaxial backscattered electrons in SEM

  • Author/Authors

    Rosenberg، نويسنده , , Noorbasha N. and Jiang، نويسنده , , C.Z. and Morin، نويسنده , , P.، نويسنده ,

  • Pages
    9
  • From page
    97
  • To page
    105
  • Abstract
    We simulate the trajectories of backscattered electrons within a SEM of particular detection geometry which is adapted to topographic contrast attenuation and Z atomic number contrast enhancement. The calculations are performed choosing the different experimentally possible conditions as regards the primary electron energy, the detector aperture angle and the energy window of the detected electrons. From such simulations, it is possible to deduce the backscattering coefficient and consequently the conditions which optimize the Z analysis, particularly in order to avoid confusion between Z and topographic contrast.
  • Keywords
    Reflection electron microscopy (REM) , Scanning electron microscopy (SEM)
  • Journal title
    Astroparticle Physics
  • Record number

    2045189