Title of article :
Field evaporation behaviour in the γ phase in Ti–Al during analysis in the tomographic atom probe
Author/Authors :
Lefebvre، نويسنده , , W and Loiseau، نويسنده , , A and Menand، نويسنده , , A، نويسنده ,
Pages :
11
From page :
77
To page :
87
Abstract :
A Ti–48 at% Al alloy has been successfully investigated, using atom probe field ion microscopy and transmission electron microscopy. After a specific heat treatment, this alloy has a (α2+γ) lamellar microstructure. Using the tomographic atom probe (TAP), it has been possible to image the stacking of superlattice planes of γ and to identify titanium as the highest evaporation field element. In addition, the influence of analysis site on atom probe measurements has been estimated for this phase. A TAP analysis has also made it possible to observe an extremely thin step along a γ/γ interface at a near atomic scale.
Keywords :
Atom probe , Field ion microscopy , 3D atom probe , Chemical order , Lamellar structure , Interface , intermetallics , TiAl
Journal title :
Astroparticle Physics
Record number :
2045428
Link To Document :
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