Title of article
Defining the parameters of a cantilever tip AFM by reference structure
Author/Authors
Bykov، نويسنده , , V.A. and Novikov، نويسنده , , Yu.A. and Rakov، نويسنده , , A.V. and Shikin، نويسنده , , S.M.، نويسنده ,
Pages
6
From page
175
To page
180
Abstract
A method of measurement and control of atomic force microscope (AFM) probe parameters is offered. The AFM real cantilever parameters are defined.
Keywords
Tip characterization , Atomic Force Microscope , AFM , Dimensional metrology , Cantilever
Journal title
Astroparticle Physics
Record number
2045568
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