Author/Authors :
Chen، نويسنده , , Yong and Kupka، نويسنده , , R.K.، نويسنده ,
Abstract :
The electromagnetic field distribution near the surface of a dielectric grating is calculated using a modified beam propagation method under total reflection condition. Results of the image contrast, the polarization dependence and the angular spectrum are given and discussed in the context of near field optical microscopy.