Author/Authors :
Vu Thien Binh and Semet، نويسنده , , V and Garcia، نويسنده , , N، نويسنده ,
Abstract :
Images of nanometric fibres of carbon and of polymers, with observation voltages around 200 V in a Fresnel projection microscope, show details less than one nanometer without any magnetic shielding. No radiation damages are detectable during the observations of the polymers. The images of the nanometric fibres have to be interpreted as Fresnel diffraction patterns from opaque objects.