Author/Authors :
Wei، نويسنده , , Pei-Kuen and Wei، نويسنده , , Chih-Chun and Hsu، نويسنده , , Jui-Hung and Fann، نويسنده , , Wunshain Fann، نويسنده ,
Abstract :
A near-field optical microscope operated simultaneously in reflection and transmission modes is demonstrated. A low noise, large area Si photodetector was mounted directly between the PZT scanning stage and the sample for the transmission measurement. In reflection mode, either a PMT or two large area Si detectors were used for the signal collection. In addition, a simple method for measuring the actual vibrational amplitude in the shear force microscope was also discussed.
