Title of article :
Microstructured polymer tips for scanning near-field optical microscopy
Author/Authors :
Stürmer، نويسنده , , Herbert and Michael Kِhler، نويسنده , , J and M. Jovin، نويسنده , , Thomas، نويسنده ,
Abstract :
A new technique for producing polymeric cantilevers with integrated tips for combined scanning-force microscopy/scanning near-field optical microscopy is described in this paper. By integration reactive ion etched polymeric and fluorescent tips to polymer-based cantilevers, it will become possible to produce apertureless sensors for a scanning near-field optical microscope with the well-known atomic-force distance control.
Keywords :
Scanning probe microscopy , Scanning near-field optical microscopy , atomic force microscopy , Reactive Ion Etching , Polymer tips
Journal title :
Astroparticle Physics
