Author/Authors :
Dong، نويسنده , , Z.-C and Yakabe، نويسنده , , T and Fujita، نويسنده , ,
H. Nejoh، نويسنده , , H، نويسنده ,
Abstract :
When the forces between an STM tip and an adsorbate are comparable in magnitude to the forces between an adsorbate and a surface, the tip, instead of being a conventional imaging probe, can cause significant surface modifications. This technique is used in our study of In on Si(1 0 0) to manipulate the In ad-dimers on the surface. While voltage pulses alone yield a poor resolution in controlled positioning, the application of large currents accompanied by the close approach of the tip to the surface, appears promising in moving In ad-dimers from one location to another. Both the effects caused by the electric fields from voltage or current pulses and possible mechanisms on the surface modification will be briefly discussed.