• Title of article

    Advanced spatially resolved EELS in the STEM

  • Author/Authors

    Batson، نويسنده , , P.E، نويسنده ,

  • Pages
    10
  • From page
    33
  • To page
    42
  • Abstract
    Commercial availability of high spatial resolution STEM instruments is leading to widespread use of EELS and ADF imaging techniques. Future instruments will need to greatly improve levels of stability and accuracy to allow use of these techniques with atomic level precision. I review some experimental results which suggest an urgent need for a 0.1 nm diameter probe with a usable EELS spectral resolution of about 100 meV.
  • Keywords
    STEM instruments , EELS and ADF imaging techniques , Atomic level analysis
  • Journal title
    Astroparticle Physics
  • Record number

    2046919

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2046919