Title of article
Preparation of damage-free glass TEM specimens
Author/Authors
Kestel، نويسنده , , Bernard J، نويسنده ,
Pages
6
From page
61
To page
66
Abstract
A jet polishing technique to chemically thin glass specimens for transmission electron microscopy (TEM) after a preliminary mechanical dimpling step has been developed. Slightly modified commercial equipment is used with automatic optical termination of the polishing process to produce foils exhibiting large, high quality, electron transparent regions.
Keywords
Glass NBS and ARM TEM specimens , Damage-free jet polishing , Automatic polishing termination
Journal title
Astroparticle Physics
Record number
2047189
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