• Title of article

    The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites

  • Author/Authors

    Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,

  • Pages
    15
  • From page
    245
  • To page
    259
  • Abstract
    High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
  • Keywords
    High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Thin films , Dispersion forces , Hamaker constant
  • Journal title
    Astroparticle Physics
  • Record number

    2047219