Title of article :
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites
Author/Authors :
Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,
Pages :
15
From page :
245
To page :
259
Abstract :
High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
Keywords :
High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Thin films , Dispersion forces , Hamaker constant
Journal title :
Astroparticle Physics
Record number :
2047219
Link To Document :
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