Title of article
The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites
Author/Authors
Knowles، نويسنده , , Kevin M. and Turan، نويسنده , , Servet، نويسنده ,
Pages
15
From page
245
To page
259
Abstract
High-resolution transmission electron microscope observations of hexagonal boron nitride – 3C silicon carbide interphase boundaries suggest that where one or more phases is highly anisotropic, an orientation dependence on equilibrium film thickness can arise. Theoretical considerations of this phenomenon in terms of the equilibrium thickness of an amorphous film between two crystalline media are consistent with the trend seen experimentally.
Keywords
High-resolution transmission electron microscopy (HRTEM) , Interfaces , ceramics , Thin films , Dispersion forces , Hamaker constant
Journal title
Astroparticle Physics
Record number
2047219
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